• VK-X3000

  • Laser Microscopes vs. White Light Interferometers

    • Measure over a 50 mm area with nanometer resolution
    • No data dropout on complex surfaces
    • Material and shape independent
    • Fully automated measurement & analysis
  • No Missing Data

    White light interferometers suffer from data dropout on samples with steep or curved surfaces, causing users to make assumptions about their sample. The VK-X is able to capture data on near-vertical surfaces, enabling users to make informed decisions about their samples.

  • Color Imaging

    The VK-X captures fully-focused, high-resolution, colored images that cannot be achieved with a white light interferometer. Magnifications up to 28,000x can be attained, providing SEM-like resolution with color information.

  • Material Independent

    White light interferometers struggle to capture data from transparent surfaces, or surfaces that do not easily reflect light. Laser microscopes are material independent, enabling data to be captured on mirrored, matte, or transparent materials.

  • Ease-of-Use

    Simply place your sample on the stage, click measure, and the VK-X3000 will automatically scan and measure your sample, with no sample prep or leveling required.

  • White Light Interferometer Data Loss

  • VK-X Full Surface Data

  • White Light Interferometer - Ink on Paper

  • VK-X - Ink on Paper

Learn more about the advantages of the VK-X!

RECOMMENDED ITEMS

VK-X3000 Series 3D Laser Scanning Microscope Catalogue

VK-X3000 Series 3D Laser Scanning Microscope Catalogue
  • [File type]PDF:6.37MB

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