High-speed 2D Optical Micrometer
TM-3000 Series

SIMULTANEOUS MEASUREMENT OF MULTIPLE OUTER DIAMETERS AND HEIGHT DIFFERENCES

INTRODUCING A MULTI-POINT OUTER DIAMETER MEASUREMENT SYSTEM

Obtain results just by placing an item

Even greater CMOS pixel subdivision for appearance identification.
Measurement is performed at the specified location.

Calibration certificate also available

Download the catalogue
for details.

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